Teradyne Announces Magnum E2 to Address Next — Generation Memory Test Demands Driven by AI and High — Performance Computing

For best results when printing this announcement, please click on link below: Teradyne Announces Magnum E2 to Address Next-Generation Memory Test Demands Driven by AI and High-Performance Computing Advanced Near-DUT architecture delivers superior high-speed signal integrity, high parallelism, and a scalable and flexible test foundation for next-generation DRAM and NAND innovations. Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, announced Magnum E2 ( ), a next-generation high-speed memory test system for advanced DRAM and flash interfaces, including LPDDR6, DDR6, GDDR7, and NAND flash. Built on Teradyne's proven Near-DUT.